Cross-sectional scanning tunneling microscopy of InAsSb/InAsP superlattices
نویسندگان
چکیده
منابع مشابه
Cross-sectional scanning tunneling microscopy of InAsSb/InAsP superlattices
Cross-sectional scanning tunneling microscopy ~STM! has been used to characterize compositional structures in InAs0.87Sb0.13 /InAs0.73P0.27 and InAs0.83Sb0.17 /InAs0.60P0.40 strained-layer superlattice structures grown by metal-organic chemical vapor deposition. High-resolution STM images of the ~110! cross section reveal compositional features within both the InAsxSb12x and InAsyP12y alloy lay...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
سال: 1999
ISSN: 0734-211X
DOI: 10.1116/1.590826